# The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

- **Source:** TED · `713490-2026`
- **Buyer:** Danmarks Tekniske Universitet - DTU
- **Published:** 2026-10-15
- **Deadline:** 2026-11-16
- **Estimated value:** —
- **CPV codes:** 38511100, 38511000, 38512100
- **Place-of-performance NUTS:** DK012, DNK
- **Buyer-address NUTS:** DK012
- **Notice type:** cn-standard / 16

## Procedure details

Source lists may span several lots; list positions do not establish relationships.

### Procedure Types

- open

### Award Criterion Names

- Price
- Quality of the solution

### Award Criterion Descriptions

- The offered price
- The description of the offered solution, please see appendix 1.

### Selection Criterion Descriptions

- As a minimum the Tenderer must provide 3 references for comparable agreements. Comparable agreements mean agreements with a value of at least DKK 10.000.000 concerning supply, delivery, installation, commissioning and acceptance of a focused ion beam scanning electron micro-scope (FIB-SEM) dual-beam platform or a comparable service. The agreement, to which the reference refers, must not be more than 5 years old. The date is calculated from the last signature on the agree-ment referred to.

### Options

- There are four options: 1) ToF-SIMS: additional licences for the ToF-SIMS acquisition and/or data-processing software (e.g. for offline analysis PCs). 2) EDS: additional licences for the EDS software platform (e.g. offline analysis licences for data processing on separate PCs). 3) Pixelated 4D-STEM detector detector for 4D-STEM acquisition in the FIB-SEM. 4) Inert-atmosphere transfer chamber/shuttle for exchange of air-sensitive samples under inert gas or vacuum (e.g. from a glovebox).

### Question Deadlines

- 2026-11-06Z

### Documents Urls

- https://eu.eu-supply.com/app/rfq/rwlentrance_s.asp?PID=461749&TID=200422092&B=

### Submission Urls

- https://eu.eu-supply.com/app/rfq/rwlentrance_s.asp?PID=461749&TID=200422092&B=

## Description

DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.

## Original notice

https://ted.europa.eu/da/notice/-/detail/713490-2026