Desktop Scanning Electron Microscope (SEM)

DTU requires delivery of a Scanning Electron Microscope (SEM). The Measurement and Instrumentation Systems division at DTU Space wants to purchase a SEM for topography imaging and chemical analysis of metallographic samples. The SEM will be a part of the Destructive Physical Analysis (DPA) laboratory, thus the majority of the samples will be non-conductive mechanically polished epoxy moulds with cross-sectioned electronics components and assemblies. A compact, robust, stable, ready to work 24/7 without state-of-the-arts maintenance, easy to run after short training SEM would fulfil our expectations.