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TED713490-2026

The procurement of the Supply, Installation and Commissioning of a Focused Ion Beam Scanning Electron Microscope (FIB-SEM) with Gallium Ion Source

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Ordregiver
Danmarks Tekniske Universitet - DTU
Oplyst værdi / estimat
—
Frist
16.11.2026
Publiceret
15.10.2026
CPV
38511100, 38511000, 38512100
Leveringssted (NUTS)
DK012, DNK
Ordregivers adresseområde (NUTS)
DK012

Dataposten opdateret . Datakilder, dækning og beregningsmetode.

Beskrivelse
DTU requires the supply, delivery, installation, commissioning and acceptance of one (1) focused ion beam scanning electron microscope (FIB-SEM) dual-beam platform. The instrument shall serve a multi-user research environment and will be used for high-resolution surface imaging, site-specific cross-sectioning, TEM lamella preparation (including automated workflows), 3D FIB-SEM tomography, gas-assisted deposition and etching, nanoscale manipulation, and elemental microanalysis by energy-dispersive X-ray spectroscopy (EDS) and ToF-SIMS.

Procedure og udbudsmateriale

Oplysninger fra bekendtgørelsen kan dække flere delkontrakter. Listerne nedenfor er separate uddrag; rækkefølgen kobler ikke et kriterium til en beskrivelse eller delkontrakt. Kontrollér krav, vægtning, frister, optioner og eventuelle rettelser i originalmaterialet.

Proceduretype (kildens kode)

  • open

Tildelingskriterier

  • Price
  • Quality of the solution

Beskrivelser af tildelingskriterier

  • The offered price
  • The description of the offered solution, please see appendix 1.

Beskrivelser af krav til deltagelse

  • As a minimum the Tenderer must provide 3 references for comparable agreements. Comparable agreements mean agreements with a value of at least DKK 10.000.000 concerning supply, delivery, installation, commissioning and acceptance of a focused ion beam scanning electron micro-scope (FIB-SEM) dual-beam platform or a comparable service. The agreement, to which the reference refers, must not be more than 5 years old. The date is calculated from the last signature on the agree-ment referred to.

Oplyste optioner

  • There are four options: 1) ToF-SIMS: additional licences for the ToF-SIMS acquisition and/or data-processing software (e.g. for offline analysis PCs). 2) EDS: additional licences for the EDS software platform (e.g. offline analysis licences for data processing on separate PCs). 3) Pixelated 4D-STEM detector detector for 4D-STEM acquisition in the FIB-SEM. 4) Inert-atmosphere transfer chamber/shuttle for exchange of air-sensitive samples under inert gas or vacuum (e.g. from a glovebox).

Oplyste spørgefrister

  • 2026-11-06Z

Udbudsmateriale

Aflevering af tilbud

Åbn originaludbud

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