Near Axis TKD detector

DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of delicate and sensitive crystalline materials. The system will be mounted and integrated into an already existing Scanning Electron Microscope. Crystal orientation mapping and strain analysis of beam sensitive thin films of functional materials at the nanometer scale is essential for understanding the underlying processes responsible for the (tailored) functionality. DTU Nanolab intends to procure a high-end Transmission Kikuchi Diffraction (TKD) acquisition system for characterization of delicate and sensitive crystalline materials. The system will be mounted and integrated into an already existing Scanning Electron Microscope. Crystal orientation mapping and strain analysis of beam sensitive thin films of functional materials at the nanometer scale is essential for understanding the underlying processes responsible for the (tailored) functionality.